Electro Migration
Due to high current density, the electrons within the metal moves with high acceleration. These electrons transfer their momentum to other atoms and also the atoms get displaced from their original position and might create voids and hillocks. Hillocks will create shorts and void will create opens between metal layers.
Input files for EM analysis
Signal EM:.v, .LIB, .SDC, .LEF, .DEF, .SPEF, .CPF, .CL, .QRC
Power EM:.v, .LIB, .SDC, .LEF, .DEF, .SPEF, .CPF, .CL, .QRC
Factors causing EM
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Opens,Shorts,Via Damage
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Strength region of high power drive strength cells
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Dense region of high activity cells
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Missing Via
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Less number of stripes
Fixes to EM
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For Signal EM
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Widening the metal
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Splitting the load
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Downsizing the cell
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For Power EM
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Widening the metal wire
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Addition of stripes
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Spreading logic